SORTEX H SpectraVision Global product manager, Melvyn Peanna says “Invaluable data on defect removal and machine wear status is easily accessible for multiple stake-holders anytime. A user log featuring time-stamped mode/control changes is also available, as well as an alarm configuration for high ejection rate due to high input contamination or changes to incoming contamination of a particular defect type,”
“This will enable processors to quickly make decisions and take action and thereby save money by either reducing waste or increasing productivity.”